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Degradation location study of proton exchange membrane at open circuit operation
Xiao, Shaohua1,2; Zhang, Huamin1; Bi, Cheng1,2; Zhang, Yu1; Zhang, Yining1,2; Dai, Hua1,2; Mai, Zhensheng1,2; Li, Xianfeng1; Zhang HM(张华民)
关键词Degradation Location Free Radical Ceria Durability
刊名JOURNAL OF POWER SOURCES
2010-08-15
DOI10.1016/j.jpowsour.2010.03.010
195期:16页:5305-5311
收录类别SCI
文章类型Article
部门归属3
项目归属303
产权排名1;1
WOS标题词Science & Technology ; Physical Sciences ; Technology
类目[WOS]Electrochemistry ; Energy & Fuels
研究领域[WOS]Electrochemistry ; Energy & Fuels
关键词[WOS]ELECTROLYTE FUEL-CELLS ; POLYMER ELECTROLYTE ; CHEMICAL DEGRADATION ; PERFLUOROSULFONIC ACID ; IONOMER MEMBRANES ; PT/C CATALYSTS ; DURABILITY ; MECHANISM ; PERFORMANCE ; MITIGATION
英文摘要In order to investigate the location of the radical-initiated membrane degradation at open circuit operation, ceria (CeO(2)) nanoparticles are firstly placed at different locations of the membranes to scavenge free radicals generated there. Scanning electron microscopy (SEM) is used to characterize cross-sectional morphology of membrane before and after the open circuit voltage (OCV) test. OCV decay rate is used as an indicator of membrane degradation rate. Composite membranes with CeO(2) nanoparticles facing anode or cathode show improved membrane durability than that of plain membrane in terms of OCV decay rate and cross-sectional morphology. CeO(2)-Nafion composite membrane with the same thickness is subsequently proposed and it obtains the best durability. It is concluded that the chemical degradation at open circuit operation occurs at both sides of anode and cathode. (C) 2010 Elsevier B.V. All rights reserved.
语种英语
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WOS记录号WOS:000277868600017
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被引频次:15[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://cas-ir.dicp.ac.cn/handle/321008/103523
专题中国科学院大连化学物理研究所
通讯作者Zhang HM(张华民)
作者单位1.Chinese Acad Sci, Dalian Inst Chem Phys, Lab PEMFC Key Mat & Technol, Dalian 116023, Peoples R China
2.Chinese Acad Sci, Grad Univ, Beijing 100039, Peoples R China
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Xiao, Shaohua,Zhang, Huamin,Bi, Cheng,et al. Degradation location study of proton exchange membrane at open circuit operation[J]. JOURNAL OF POWER SOURCES,2010,195(16):5305-5311.
APA Xiao, Shaohua.,Zhang, Huamin.,Bi, Cheng.,Zhang, Yu.,Zhang, Yining.,...&张华民.(2010).Degradation location study of proton exchange membrane at open circuit operation.JOURNAL OF POWER SOURCES,195(16),5305-5311.
MLA Xiao, Shaohua,et al."Degradation location study of proton exchange membrane at open circuit operation".JOURNAL OF POWER SOURCES 195.16(2010):5305-5311.
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