DICP OpenIR
Subject Area物理化学
无损伤式荧光灯气体杂质检测仪; 无损伤式荧光灯气体杂质检测仪; 无损伤式荧光灯气体杂质检测仪; 无损伤式荧光灯气体杂质检测仪
关亚风; 邱长春; 唐学渊; 韩同生
Application NumberCN85102703
Patent NumberCN85102703
Application Date1985-04-01
1986-09-24
Patent Agent汪惠民
Rights Holder中国科学院大连化学物理研究所
Subtype发明
Keyword物理化学
Certificate Number带填写
PCT Attributes
Country中国
Department大连化物所
Contribution Rank1
无损伤式荧光灯气体杂质检测仪; 无损伤式荧光灯气体杂质检测仪; 无损伤式荧光灯气体杂质检测仪; 无损伤式荧光灯气体杂质检测仪
Date Available1986-09-24 ; 2011-07-11
description.patentprioritydata待填写
description.pctapplicationdata待填写
description.pctpublicationdata待填写
Status视撤
Funding Organization待填写
Abstract荧光灯气体杂质检测仪用于检测放电管、特别是荧光灯的气体杂质含量.检测仪设置了检测指示部分,温度补偿电路和杂质浓度显示器,能自动显示灯管杂质浓度与击穿放电阈值.检测器灵敏度高,检测杂质浓度范围是P杂/P总10-5~2×10-2,适用温度和压强范围宽(15~35℃和16~3.5乇),所发明的检测仪既可用于检测单只荧光灯管,也可以利用本仪器寻找生产线的故障和生产的在线检测.; 带填写
Language中文
Document Type专利
Identifierhttp://cas-ir.dicp.ac.cn/handle/321008/111123
Collection中国科学院大连化学物理研究所
Recommended Citation
GB/T 7714
关亚风,邱长春,唐学渊,等. 无损伤式荧光灯气体杂质检测仪, 无损伤式荧光灯气体杂质检测仪, 无损伤式荧光灯气体杂质检测仪, 无损伤式荧光灯气体杂质检测仪. CN85102703[P]. 1986-09-24.
Files in This Item:
There are no files associated with this item.
Related Services
Recommend this item
Bookmark
Usage statistics
Export to Endnote
Google Scholar
Similar articles in Google Scholar
[关亚风]'s Articles
[邱长春]'s Articles
[唐学渊]'s Articles
Baidu academic
Similar articles in Baidu academic
[关亚风]'s Articles
[邱长春]'s Articles
[唐学渊]'s Articles
Bing Scholar
Similar articles in Bing Scholar
[关亚风]'s Articles
[邱长春]'s Articles
[唐学渊]'s Articles
Terms of Use
No data!
Social Bookmark/Share
All comments (0)
No comment.
 

Items in the repository are protected by copyright, with all rights reserved, unless otherwise indicated.