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学科主题: 物理化学
题名: Degradation Location Study of Proton Exchange Membrane at Open Circuit Operation
作者: Xiao SH(肖少华) ;  Zhang HM(张华民) ;  Bi C(毕成) ;  Zhang YN(张益宁)
会议名称: The 8th International Symposium on New Materials and Nano-Materials for Electrochemical Systems
会议日期: 2010-7-11
出版日期: 2010-07-11
会议地点: 中国
通讯作者: 张华民
部门归属: 三室
主办者: 上海交通大学
摘要: Open circuit voltage(OCV)test is widely accepted as an accelerated test for evaluatiing membrane durability. Free radicals (HO and HOO)are usually thought to be responsible for membrane degradation. The accelerated degradation at OCV test is generally attributed to the radicals generated by crossover gas. The membrane degradation can only happen in the case of the coexistence of H2, O2 and catalyst[1-2], so the radicals could be generated at anode/cathode side[3-4], suggesting the radical-initiated membrane degradation could occur at anode or cathode side under OCV condition. However, the location of chemical degradation at OCV test is still ambiguous.
语种: 中文
内容类型: 会议论文
URI标识: http://cas-ir.dicp.ac.cn/handle/321008/114240
Appears in Collections:中国科学院大连化学物理研究所_会议论文

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Recommended Citation:
Xiao SH,Zhang HM,Bi C,et al. Degradation Location Study of Proton Exchange Membrane at Open Circuit Operation[C]. 见:The 8th International Symposium on New Materials and Nano-Materials for Electrochemical Systems. 中国. 2010-7-11.
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