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学科主题: 物理化学
题名: A Compact Low Energy Electron Microscope for Surface Analysis
作者: Zhang, Guan-hua1;  Sun, Ju-long1;  Jin, Yan-ling1;  Zang, Kan2;  Guo, Fang-zhun2;  Yang, Xue-ming1
通讯作者: 张冠华 ;  杨学明
关键词: Low energy electron microscopy ;  Flange-on ;  Femtosecond laser ;  Lateral resolution ;  Small deflection angle
刊名: CHINESE JOURNAL OF CHEMICAL PHYSICS
发表日期: 2013-08-27
DOI: 10.1063/1674-0068/26/04/369-373
卷: 26, 期:4, 页:369-373
收录类别: SCI
文章类型: Article
部门归属: 11
项目归属: 1102
产权排名: 1,1
WOS标题词: Science & Technology ;  Physical Sciences
类目[WOS]: Physics, Atomic, Molecular & Chemical
研究领域[WOS]: Physics
英文摘要: The description and function characterization of a flange-on type low energy electron microscope are given. In this microscope a magnetic beam separator with 10 degrees deflection angle is used in order to facilitate compacting the instrument on a single 10 in. flange. Meanwhile some correcting elements in the electron optical system are simplified to reduce the complexities of construction and operation. The sample is set close to ground potential, so that all the electrostatic lenses are easily to float at high voltages. The performance of the microscope in typical low energy electron microscopy, low energy electron diffraction and photoemission electron microscopy modes is demonstrated through several experiments. A lateral resolution of 51 nm is estimated for low energy electron microscopy imaging. With femtosecond laser as light source, the consequent nonlinear photoemission makes this microscope also suitable for the observation of optical near field phenomena and a lateral resolution of 110 nm is obtained.
关键词[WOS]: MULTIPHOTON PHOTOEMISSION ;  INTERFACE ;  SI(111)
语种: 英语
WOS记录号: WOS:000324665200001
Citation statistics: 
内容类型: 期刊论文
URI标识: http://cas-ir.dicp.ac.cn/handle/321008/117535
Appears in Collections:中国科学院大连化学物理研究所_期刊论文

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作者单位: 1.Chinese Acad Sci, Dalian Inst Chem Phys, Dalian 116023, Peoples R China
2.Dalian Jiaotong Univ, Dalian 116028, Peoples R China

Recommended Citation:
Zhang, Guan-hua,Sun, Ju-long,Jin, Yan-ling,et al. A Compact Low Energy Electron Microscope for Surface Analysis[J]. CHINESE JOURNAL OF CHEMICAL PHYSICS,2013,26(4):369-373.
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