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题名: New evidences on photoemission electron impact ionization in time-of-flight mass spectrometer
作者: Wang, L;  Li, HY;  Bai, JL;  Lu, RC
关键词: laser induced photoelectron ;  multiple charged ions ;  electron impact ;  ionization ;  time-of-flight mass spectrometer
刊名: INTERNET JOURNAL OF CHEMISTRY
发表日期: 1998
卷: 1, 期:4, 页:CP1-U21
收录类别: SCI
文章类型: Article
WOS标题词: Science & Technology ;  Physical Sciences
类目[WOS]: Chemistry, Multidisciplinary
研究领域[WOS]: Chemistry
英文摘要: Photoelectron impact ionization (PEI) of noble gases has been investigated in a time of flight mass spectrometer (TOF-MS). Multicharged ions of He, Ne, Ar, Kr and Xe were produced when the gases were injected into the ionization region and a focused laser beam struck the extractor grid surfaces in the TOF-MS. A delayable pulsed accelerating electric field was used, for the first time, to test the effect of the laser induced photoelectrons on the ionization. A special photoelectron gun was designed to control the energy of the photoelectron beam. This modification made it possible to separate the PEI from multiphoton ionization (MPI). The observations showed that the multiple charged ions could be only formed by the PEI in our experiments, possibly formed step by step. With the new design of the electron gun, the TOF-MS can be operated in either MPI mode or PEI mode.
语种: 英语
WOS记录号: WOS:000173142000001
Citation statistics: 
内容类型: 期刊论文
URI标识: http://cas-ir.dicp.ac.cn/handle/321008/138107
Appears in Collections:中国科学院大连化学物理研究所_期刊论文

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作者单位: 1.Chinese Acad Sci, Dalian Inst Chem Phys, State Key Lab Mol React Dynam, Dalian 116023, Peoples R China

Recommended Citation:
Wang, L,Li, HY,Bai, JL,et al. New evidences on photoemission electron impact ionization in time-of-flight mass spectrometer[J]. INTERNET JOURNAL OF CHEMISTRY,1998,1(4):CP1-U21.
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