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学科主题物理化学
Degradation and stabilization of perovskite membranes containing silicon impurity at low temperature
Liu, Yan1,2; Zhu, Xuefeng1; Li, Mingrun1; Li, Wenping1,2; Yang, Weishen1; Zhu XF(朱雪峰); Yang WS(杨维慎)
关键词Miec Membrane Silicon Impurity Low Temperature Degradation Perovskite
刊名JOURNAL OF MEMBRANE SCIENCE
2015-10-15
DOI10.1016/j.memsci.2015.05.063
492期:1页:173-180
收录类别SCI
文章类型Article
WOS标题词Science & Technology ; Technology ; Physical Sciences
类目[WOS]Engineering, Chemical ; Polymer Science
研究领域[WOS]Engineering ; Polymer Science
关键词[WOS]OXYGEN PERMEABLE MEMBRANE ; DUAL-PHASE MEMBRANES ; MIXED-OXIDE (A,B)O ; CERAMIC MEMBRANES ; CATHODE MATERIAL ; STRUCTURAL STABILITY ; HYDROGEN-PRODUCTION ; POTENTIAL GRADIENT ; CO2 CAPTURE ; FUEL-CELLS
英文摘要The oxygen permeation flux of a mixed ionic-electronic conducting membrane BaCe0.1Co0.4Fe0.5O3-delta (BCCF) decreased by 62% after 477 h on-stream operation under air/He gradient at 600 degrees C. To understand this phenomenon, the spent membrane was examined via several characterization techniques. Scanning electron microscopy (SEM) and energy dispersive X-ray (EDS) analyses revealed that the surface of the sweep side has a higher silicon impurity content than that of the feed side. In fact, the BCCF powder contained up to 140 ppm of silicon impurities, which originated from the original chemicals and/or was introduced during preparation of the material. After the 477 h operation at 600 degrees C, a similar to 25 nm-thick amorphous silicon-containing layer was detected by high resolution transmission electron microscopy (HRTEM) on the sweep side surface of the spent membrane. A possible mechanism related to silicon migration from membrane bulk to surfaces was proposed to explain the degradation phenomenon. To overcome the negative effects of silicon impurity, a simple and effective method was proposed to stabilize the oxygen permeation fluxes at low temperatures, i.e. coating a porous Sm0.5Sr0.5CoO3-delta (SSC) catalyst on both surfaces of the membrane to accommodate the silicon impuriLy and accelerate oxygen exchange kinetics. With this method, the oxygen permeation was stabilized for 500 h at 600 degrees C. (C) 2015 Elsevier B.V. All rights reserved.
语种英语
WOS记录号WOS:000358433600019
引用统计
被引频次:9[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://cas-ir.dicp.ac.cn/handle/321008/143769
专题中国科学院大连化学物理研究所
通讯作者Zhu XF(朱雪峰); Yang WS(杨维慎)
作者单位1.Chinese Acad Sci, Dalian Inst Chem Phys, State Key Lab Catalysis, Dalian 116023, Peoples R China
2.Univ Chinese Acad Sci, Beijing 100039, Peoples R China
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GB/T 7714
Liu, Yan,Zhu, Xuefeng,Li, Mingrun,et al. Degradation and stabilization of perovskite membranes containing silicon impurity at low temperature[J]. JOURNAL OF MEMBRANE SCIENCE,2015,492(1):173-180.
APA Liu, Yan.,Zhu, Xuefeng.,Li, Mingrun.,Li, Wenping.,Yang, Weishen.,...&杨维慎.(2015).Degradation and stabilization of perovskite membranes containing silicon impurity at low temperature.JOURNAL OF MEMBRANE SCIENCE,492(1),173-180.
MLA Liu, Yan,et al."Degradation and stabilization of perovskite membranes containing silicon impurity at low temperature".JOURNAL OF MEMBRANE SCIENCE 492.1(2015):173-180.
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