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A Reflectron Time-of-Flight Mass Spectrometer with a Nano-Electrospray Ionization Source for Study of Metal Cluster Compounds
Wu, Xiao-hu1; Xie, Hua1; Liu, Zhi-ling2; Su, Hai-feng3,4; Lin, Shui-chao3,4; Tang, Zi-chao1,3,4
KeywordNano-electrospray Ionization Source Ion transmissIon And Focus System Reflectron Time-of-flight Mass Spectrometer Metal Cluster Compounds Single Crystal X-ray Diffraction
Source PublicationCHINESE JOURNAL OF CHEMICAL PHYSICS
2016-08-01
ISSN1674-0068
DOI10.1063/1674-0068/29/cjcp1601019
Volume29Issue:4Pages:401-406
Indexed BySCI
SubtypeArticle
WOS HeadingsScience & Technology ; Physical Sciences
WOS SubjectPhysics, Atomic, Molecular & Chemical
WOS Research AreaPhysics
WOS KeywordGOLD CLUSTERS ; ION-SOURCE ; NANOCLUSTERS ; NANOMOLECULES ; INTERFACE ; MOTIF
AbstractAn experiment facility has been set up for the study of metal cluster compounds in our laboratory, which consists of a nano-electrospray ionization source, an ion transmission and focus system, and a reflectron time-of-flight mass spectrometer. Taking advantage of the nano-electrospray ionization source, polyvalent ions are usually produced in the "ionization" process and the obtained mass resolution of the equipment is over 8000. The molecular ion peaks of metal cluster compounds [Au-20(PPhPy2)(10)Cl-2](SbF6)(4), where PPhpy(2)=bis (2-pyridyl)phenylphosphine, and [Au6Ag2(C)L-6](BF4)(4), where L=2-(diphenylphosphino)-5-methylpyridine, are distinguished in the respective mass spectrum, accompanied by some fragment ion peaks. In addition, the mass-to-charge ratios of the parent ions are determinated. Preliminary results suggest that the device is a powerful tool for the study of metal cluster compounds. It turns out that the information obtained by the instrumentation serves as an essential supplement to single crystal X-ray diffraction for structure characterization of metal cluster compounds.
Language英语
WOS IDWOS:000383114400001
PublisherCHINESE PHYSICAL SOC
Citation statistics
Document Type期刊论文
Identifierhttp://cas-ir.dicp.ac.cn/handle/321008/170259
Collection中国科学院大连化学物理研究所
Corresponding AuthorTang, Zi-chao
Affiliation1.Chinese Acad Sci, State Key Lab Mol React Dynam, Dalian Inst Chem Phys, Dalian 116023, Peoples R China
2.Shanxi Normal Univ, Sch Chem & Mat Sci, Linfen 041004, Peoples R China
3.Xiamen Univ, State Key Lab Phys Chem Solid Surfaces, Collaborat Innovat Ctr Chem Energy Mat, Xiamen 361005, Peoples R China
4.Xiamen Univ, Dept Chem, Coll Chem & Chem Engn, Xiamen 361005, Peoples R China
Recommended Citation
GB/T 7714
Wu, Xiao-hu,Xie, Hua,Liu, Zhi-ling,et al. A Reflectron Time-of-Flight Mass Spectrometer with a Nano-Electrospray Ionization Source for Study of Metal Cluster Compounds[J]. CHINESE JOURNAL OF CHEMICAL PHYSICS,2016,29(4):401-406.
APA Wu, Xiao-hu,Xie, Hua,Liu, Zhi-ling,Su, Hai-feng,Lin, Shui-chao,&Tang, Zi-chao.(2016).A Reflectron Time-of-Flight Mass Spectrometer with a Nano-Electrospray Ionization Source for Study of Metal Cluster Compounds.CHINESE JOURNAL OF CHEMICAL PHYSICS,29(4),401-406.
MLA Wu, Xiao-hu,et al."A Reflectron Time-of-Flight Mass Spectrometer with a Nano-Electrospray Ionization Source for Study of Metal Cluster Compounds".CHINESE JOURNAL OF CHEMICAL PHYSICS 29.4(2016):401-406.
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