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TEM and STEM Studies on the Cross-sectional Morphologies of Dual-/Tri-layer Broadband SiO2 Antireflective Films 期刊论文
Nanoscale Research Letters, 2018, 卷号: 13, 期号: 1
Authors:  Wang,Shuangyue;  Yan,Hongwei;  Li,Dengji;  Qiao,Liang;  Han,Shaobo;  Yuan,Xiaodong;  Liu,Wei;  Xiang,Xia;  Zu,Xiaotao
Favorite  |  View/Download:5/0  |  Submit date:2019/06/20
Sol–gel process  Antireflective film  TEM  STEM  Density ratio