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Resolution deterioration in emission electron microscopy due to object roughness 期刊论文
ANNALEN DER PHYSIK, 2000, 卷号: 9, 期号: 6, 页码: 441-451
Authors:  Nepijko, SA;  Sedov, NN;  Schonhense, G;  Escher, M;  Bao, XH;  Huang, WX
Adobe PDF(246Kb)  |  Favorite  |  View/Download:259/68  |  Submit date:2010/11/30
Emission Electron Microscope (Eem)  Resolution  Object Roughness  Computer Simulation