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Nanoimaging of Electronic Heterogeneity in Bi2Se3 and Sb2Te3 Nanocrystals 期刊论文
ADVANCED ELECTRONIC MATERIALS, 2018, 卷号: 4, 期号: 1
Authors:  Lu, Xiaowei;  Khatib, Omar;  Du, Xutao;  Duan, Jiahua;  Wei, Wei;  Liu, Xianli;  Bechtel, Hans A.;  D'Apuzzo, Fausto;  Yan, Mingtao;  Buyanin, Alexander;  Fu, Qiang;  Chen, Jianing;  Salmeron, Miquel;  Zeng, Jie;  Raschke, Markus B.;  Jiang, Peng;  Bao, Xinhe
Favorite  |  View/Download:4/0  |  Submit date:2019/06/20
Correlated Imaging  Electronic Heterogeneity  Mirror Electron Microscopy  Scanning Near Field Optical Microscopy  Topological Insulator